A Review of XPS Data-Banks

Information derived or interpreted from analyses of X-ray Photoelectron Spectroscopy (XPS) data is frequently used to make valuable decisions in business, product development, process improvement and materials characterization. For this reason, it is important to understand the characteristics of the reference data stored in the data-banks that are currently used to obtain this information. This review addresses characteristic features, content and problems with the spectra and BEs provided in various XPS databanks. Two different types of data-banks, numerical and spectral, are discussed. Data-banks are commercially available in various forms, i.e. handbooks, scientific journals, internet based data-banks and computer-based data-banks, including: (1) PHI Handbook of XPS (1979), (2) NIST SRD-20 XPS Database (1989), (3) Wiley Practical Surface Analysis 1 and 2 ed. (1990), (4) SASJ ComPro v8 and Data-bank (1990-2004), (5) JEOL Handbook of XPS (1991), (6) CRC Practical Handbook of Spectroscopy (1991), (7) PHI Handbook of XPS (1992), (8) Wiley High Resolution XPS of Organic Polymers – Scienta ESCA 300 Database (1992), (9) XI SpecMaster Pro XPS Database (1993), (10) AVS Surface Science Spectra (1993), (11) XI Web Site XPS Data Tables and Reference Data (1997), (12) XI PDF of Handbooks of Monochromatic XPS Spectra – The Elements and Native Oxides (1999), (13) Wiley Handbooks of Monochromatic XPS Spectra, 3 Volume series (2000), (14) NIST SRD-20 XPS Database v3 (2000), (15) LaSurface Web Site Database XPS (2001), (16) XI Handbooks of Monochromatic XPS Spectra, 5 Volume series (2004) and (17) XI PDF of Handbooks of Monochromatic XPS Spectra – Commercially Pure Binary Oxides (2005). At the end of this review there is a list of recommendations for the design and content of future XPS data-banks. Copyright © 2007 XPS International LLC